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Simultaneous extraction of recoverable and permanent components contributing to bias-temperature instability

dc.contributor.authorGrasser, T.
dc.contributor.authorKaczer, Ben
dc.contributor.authorHehenberger, P.
dc.contributor.authorGös, W.
dc.contributor.authorO'Connor, Robert
dc.contributor.authorReisinger, H.
dc.contributor.authorGustin, W.
dc.contributor.authorSchlünder, C.
dc.date.accessioned2021-10-16T16:22:42Z
dc.date.available2021-10-16T16:22:42Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12223
dc.sourceIIOimport
dc.titleSimultaneous extraction of recoverable and permanent components contributing to bias-temperature instability
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewno
dc.source.beginpage801
dc.source.endpage804
dc.source.conferenceTechnical Digest International Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2007
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - imec


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