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The universality of NBTI relaxation and its implications for modeling and characterization

dc.contributor.authorGrasser, Tibor
dc.contributor.authorGos, Wolfgang
dc.contributor.authorSverdlov, Victor
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-16T16:22:55Z
dc.date.available2021-10-16T16:22:55Z
dc.date.issued2007-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12224
dc.sourceIIOimport
dc.titleThe universality of NBTI relaxation and its implications for modeling and characterization
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage268
dc.source.endpage280
dc.source.conferenceProceedings 45th Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate15/04/2007
dc.source.conferencelocationPhoenix, AZ USA
imec.availabilityPublished - imec


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