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Negative bias temperature instability: recoverable versus permanent degradation

dc.contributor.authorGrasser, Tibor
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-16T16:23:07Z
dc.date.available2021-10-16T16:23:07Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12225
dc.sourceIIOimport
dc.titleNegative bias temperature instability: recoverable versus permanent degradation
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage127
dc.source.endpage130
dc.source.conferenceProceedings of the 37th European Solid-State Device Research Conference - ESSDERC
dc.source.conferencedate11/09/2007
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - open access


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