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W-band speckle contrast images for inspection of concealed objects

dc.contributor.authorJaeger, I.
dc.contributor.authorZhang, L.
dc.contributor.authorStiens, J.
dc.contributor.authorSahli, Hichem
dc.contributor.authorVounckx, Roger
dc.date.accessioned2021-10-16T16:52:34Z
dc.date.available2021-10-16T16:52:34Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12345
dc.sourceIIOimport
dc.titleW-band speckle contrast images for inspection of concealed objects
dc.typeProceedings paper
dc.contributor.imecauthorSahli, Hichem
dc.contributor.imecauthorVounckx, Roger
dc.contributor.orcidimecSahli, Hichem::0000-0002-1774-2970
dc.source.peerreviewno
dc.source.beginpage6616Y
dc.source.conferenceOptical Measurement Systems for Industrial Inspection V
dc.source.conferencedate18/06/2007
dc.source.conferencelocationMünchen Germany
imec.availabilityPublished - imec
imec.internalnotesProceedings of SPIE; Vol. 6616


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