Publication:

Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation

Date

2007

Journal article

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Files

14513.pdf 646.32 KB

Author(s)

;

De Jaeger, Brice

;

Nicholas, Gareth

;

;

Degraeve, Robin

;

;

Pourtois, Geoffrey

;

;

;

Groeseneken, Guido

Journal

Microelectronic Engineering

Metrics

1898 since deposited on 2021-10-16

2last month

Acq. date: 2026-01-07