Publication:
Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation
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1897 since deposited on 2021-10-16
2last month
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Acq. date: 2025-12-09
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Views
1897 since deposited on 2021-10-16
2last month
1last week
Acq. date: 2025-12-09
Citations