Show simple item record

Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation

dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorNicholas, Gareth
dc.contributor.authorMartens, Koen
dc.contributor.authorDegraeve, Robin
dc.contributor.authorHoussa, Michel
dc.contributor.authorPourtois, Geoffrey
dc.contributor.authorLeys, Frederik
dc.contributor.authorMeuris, Marc
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T17:00:13Z
dc.date.available2021-10-16T17:00:13Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12374
dc.sourceIIOimport
dc.titleElectrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorPourtois, Geoffrey
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecPourtois, Geoffrey::0000-0003-2597-8534
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage2067
dc.source.endpage2070
dc.source.journalMicroelectronic Engineering
dc.source.issue9_10
dc.source.volume84
imec.availabilityPublished - imec
imec.internalnotespresented at INFOS 2007


Files in this item

Thumbnail
Name:
14513.pdf
Size:
646.3Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record