dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | De Jaeger, Brice | |
dc.contributor.author | Nicholas, Gareth | |
dc.contributor.author | Martens, Koen | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Houssa, Michel | |
dc.contributor.author | Pourtois, Geoffrey | |
dc.contributor.author | Leys, Frederik | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-16T17:00:13Z | |
dc.date.available | 2021-10-16T17:00:13Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12374 | |
dc.source | IIOimport | |
dc.title | Electrical and reliability characterization of metal-gate/HfO2/Ge FET's with Si passivation | |
dc.type | Journal article | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.imecauthor | De Jaeger, Brice | |
dc.contributor.imecauthor | Martens, Koen | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Houssa, Michel | |
dc.contributor.imecauthor | Pourtois, Geoffrey | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.contributor.orcidimec | De Jaeger, Brice::0000-0001-8804-7556 | |
dc.contributor.orcidimec | Martens, Koen::0000-0001-7135-5536 | |
dc.contributor.orcidimec | Houssa, Michel::0000-0003-1844-3515 | |
dc.contributor.orcidimec | Pourtois, Geoffrey::0000-0003-2597-8534 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 2067 | |
dc.source.endpage | 2070 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 9_10 | |
dc.source.volume | 84 | |
imec.availability | Published - imec | |
imec.internalnotes | presented at INFOS 2007 | |