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Reliability screening oh high-k dielectrics based on voltage ramp stress

dc.contributor.authorKerber, A.
dc.contributor.authorPantisano, Luigi
dc.contributor.authorVeloso, Anabela
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorKerber, M.
dc.date.accessioned2021-10-16T17:04:37Z
dc.date.available2021-10-16T17:04:37Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12391
dc.sourceIIOimport
dc.titleReliability screening oh high-k dielectrics based on voltage ramp stress
dc.typeJournal article
dc.contributor.imecauthorVeloso, Anabela
dc.contributor.imecauthorGroeseneken, Guido
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage513
dc.source.endpage517
dc.source.journalMicroelectronics Reliability
dc.source.issue4_5
dc.source.volume47
imec.availabilityPublished - open access


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