Reliability screening oh high-k dielectrics based on voltage ramp stress

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Authors

Kerber, A.; Pantisano, Luigi; Veloso, Anabela; Groeseneken, Guido; Kerber, M.

Issue

4_5

Journal

Microelectronics Reliability

Volume

47

Title

Reliability screening oh high-k dielectrics based on voltage ramp stress

Publication type

Journal article

Embargo date

9999-12-31

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