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Reliability screening oh high-k dielectrics based on voltage ramp stress
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1 since deposited on 2021-10-16
Acq. date: 2025-10-23
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1925 since deposited on 2021-10-16
Acq. date: 2025-10-23
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1 since deposited on 2021-10-16
Acq. date: 2025-10-23
Views
1925 since deposited on 2021-10-16
Acq. date: 2025-10-23
Citations