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dc.contributor.authorKilchytska, Valeria
dc.contributor.authorFlandre, Denis
dc.contributor.authorSimon, Pascal
dc.contributor.authorRaskin, Jean-Pierre
dc.contributor.authorParvais, Bertrand
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.date.accessioned2021-10-16T17:05:57Z
dc.date.available2021-10-16T17:05:57Z
dc.date.issued2007-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12396
dc.sourceIIOimport
dc.titleFinFETs perspectives for high-temperature applications
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.conference6th HITEN Conference
dc.source.conferencedate17/09/2007
dc.source.conferencelocationOxford UK
imec.availabilityPublished - imec


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