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Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics

dc.contributor.authorDe Schepper, Luc
dc.contributor.authorDe Ceuninck, Ward
dc.contributor.authorLekens, Geert
dc.contributor.authorStals, Lambert
dc.contributor.authorVanhecke, Bruno
dc.contributor.authorRoggen, Jean
dc.contributor.authorBeyne, Eric
dc.contributor.authorTielemans, Luc
dc.date.accessioned2021-09-29T12:40:43Z
dc.date.available2021-09-29T12:40:43Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/123
dc.sourceIIOimport
dc.titleAccelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
dc.typeJournal article
dc.contributor.imecauthorDe Ceuninck, Ward
dc.contributor.imecauthorLekens, Geert
dc.contributor.imecauthorBeyne, Eric
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage15
dc.source.endpage26
dc.source.journalQuality and Reliability Engineering International
dc.source.issue1
dc.source.volume10
imec.availabilityPublished - open access


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