SUB-45 nm technology and design challenges
| dc.contributor.author | Knoblinger, Gerhard | |
| dc.contributor.author | Tschanz, James | |
| dc.contributor.author | Marchal, Pol | |
| dc.date.accessioned | 2021-10-16T17:09:33Z | |
| dc.date.available | 2021-10-16T17:09:33Z | |
| dc.date.issued | 2007 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12409 | |
| dc.source | IIOimport | |
| dc.title | SUB-45 nm technology and design challenges | |
| dc.type | Proceedings paper | |
| dc.source.peerreview | no | |
| dc.source.conference | 8th International Symposium on Quality of Electronic Design - ISQED | |
| dc.source.conferencedate | 26/03/2007 | |
| dc.source.conferencelocation | San Jose, CA USA | |
| imec.availability | Published - imec | |
| imec.internalnotes | Tutorial |
Files in this item
| Files | Size | Format | View |
|---|---|---|---|
|
There are no files associated with this item. |
|||