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dc.contributor.authorLaureyn, Wim
dc.contributor.authorLiu, Chengxun
dc.contributor.authorReekmans, Gunter
dc.contributor.authorDe Palma, Randy
dc.contributor.authorBonroy, Kristien
dc.contributor.authorJans, Hilde
dc.contributor.authorJans, Karolien
dc.contributor.authorPeeters, Sara
dc.contributor.authorBartic, Carmen
dc.contributor.authorLagae, Liesbet
dc.contributor.authorBorghs, Gustaaf
dc.date.accessioned2021-10-16T17:19:08Z
dc.date.available2021-10-16T17:19:08Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12445
dc.sourceIIOimport
dc.titleNovel diagnostic tools inspired by microelectronics and nanotechnology
dc.typeProceedings paper
dc.contributor.imecauthorLiu, Chengxun
dc.contributor.imecauthorReekmans, Gunter
dc.contributor.imecauthorJans, Hilde
dc.contributor.imecauthorJans, Karolien
dc.contributor.imecauthorBartic, Carmen
dc.contributor.imecauthorLagae, Liesbet
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.orcidimecLiu, Chengxun::0000-0002-2104-4657
dc.source.peerreviewno
dc.source.conferenceKnowledge for Growth
dc.source.conferencedate8/06/2007
dc.source.conferencelocationGent Belgium
imec.availabilityPublished - imec


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