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Near-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems

dc.contributor.authorHaelvoet, Kurt
dc.contributor.authorCriel, Steven
dc.contributor.authorDobbelaere, Franky
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Langhe, Pascal
dc.contributor.authorDe Smedt, R.
dc.date.accessioned2021-09-29T14:32:02Z
dc.date.available2021-09-29T14:32:02Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1245
dc.sourceIIOimport
dc.titleNear-field scanner for the accurate characterization of electromagnetic fields in the close vicinity of electronic devices and systems
dc.typeProceedings paper
dc.contributor.imecauthorMartens, Luc
dc.source.peerreviewno
dc.source.beginpage1119
dc.source.endpage1123
dc.source.conferenceProceedings IEEE Instrumentation and Measurement Technology Conference
dc.source.conferencedate4/06/1996
dc.source.conferencelocationBrussels Belgium
imec.availabilityPublished - imec


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