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Transition probabilities and noise spectra in submicron MOSFETs

dc.contributor.authorHaertler, C.
dc.contributor.authorGolze, U.
dc.contributor.authorSikula, J.
dc.contributor.authorSikulova, M.
dc.contributor.authorHruska, P.
dc.contributor.authorVasina, Petr
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-09-29T14:32:25Z
dc.date.available2021-09-29T14:32:25Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1248
dc.sourceIIOimport
dc.titleTransition probabilities and noise spectra in submicron MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage78
dc.source.endpage82
dc.source.conferenceProceedings 3rd ELEN Workshop
dc.source.conferencedate5/11/1996
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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