Low-temperature enbrittlement of lead-free solders in joint level impact testing

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Authors
Limaye, Paresh; Maurissen, Wout; Lambrinou, Konstantza; Duflos, Frederic; Vandevelde, Bart; Allaert, Bart; Hillaert, Joost; Vandepitte, Dirk; Verlinden, Bert
Conference
9th Electronics Packaging Conference - EPTC
Title
Low-temperature enbrittlement of lead-free solders in joint level impact testing
Publication type
Proceedings paper
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