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Charge pumping characterization of germanium MOSFETs

dc.contributor.authorMartens, Koen
dc.contributor.authorKaczer, Ben
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorMeuris, Marc
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T17:51:24Z
dc.date.available2021-10-16T17:51:24Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12558
dc.sourceIIOimport
dc.titleCharge pumping characterization of germanium MOSFETs
dc.typeOral presentation
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.source.peerreviewno
dc.source.conference38th IEEE Semiconductor Interface Specialists Conference
dc.source.conferencedate6/12/2007
dc.source.conferencelocationArlington, VA USA
imec.availabilityPublished - imec


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