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Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics

dc.contributor.authorMartens, Koen
dc.contributor.authorWang, Wenfei
dc.contributor.authorDe Keersmaecker, Koen
dc.contributor.authorBorghs, Gustaaf
dc.contributor.authorGroeseneken, Guido
dc.contributor.authorMaes, Herman
dc.date.accessioned2021-10-16T17:52:00Z
dc.date.available2021-10-16T17:52:00Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12560
dc.sourceIIOimport
dc.titleImpact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
dc.typeJournal article
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorWang, Wenfei
dc.contributor.imecauthorBorghs, Gustaaf
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2146
dc.source.endpage2149
dc.source.journalMicroelectronic Engineering
dc.source.issue9_10
dc.source.volume84
imec.availabilityPublished - open access
imec.internalnotesPaper from INFOS 2007


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