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Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
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Authors
Martens, Koen
;
Wang, Wenfei
;
De Keersmaecker, Koen
;
Borghs, Gustaaf
;
Groeseneken, Guido
;
Maes, Herman
Issue
9_10
Journal
Microelectronic Engineering
Volume
84
Title
Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
Publication type
Journal article
Embargo date
9999-12-31
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