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Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
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Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Martens, Koen
;
Wang, Wenfei
;
De Keersmaecker, Koen
;
Borghs, Gustaaf
;
Groeseneken, Guido
;
Maes, Herman
Journal
Microelectronic Engineering
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1875
since deposited on 2021-10-16
Acq. date: 2025-12-18
Citations
Metrics
Views
1875
since deposited on 2021-10-16
Acq. date: 2025-12-18
Citations