Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics

dc.contributor.author	Martens, Koen
dc.contributor.author	Wang, Wenfei
dc.contributor.author	De Keersmaecker, Koen
dc.contributor.author	Borghs, Gustaaf
dc.contributor.author	Groeseneken, Guido
dc.contributor.author	Maes, Herman
dc.contributor.imecauthor	Martens, Koen
dc.contributor.imecauthor	Wang, Wenfei
dc.contributor.imecauthor	Borghs, Gustaaf
dc.contributor.imecauthor	Groeseneken, Guido
dc.contributor.orcidimec	Martens, Koen::0000-0001-7135-5536
dc.date.accessioned	2021-10-16T17:52:00Z
dc.date.available	2021-10-16T17:52:00Z
dc.date.embargo	9999-12-31
dc.date.issued	2007
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/12560
dc.source.beginpage	2146
dc.source.endpage	2149
dc.source.issue	9_10
dc.source.journal	Microelectronic Engineering
dc.source.volume	84
dc.title	Impact of weak Fermi-level pinning on the correct interpretation of III-V MOS C-V and G-V characteristics
dc.type	Journal article
dspace.entity.type	Publication
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