dc.contributor.author | McGilvery, C.M. | |
dc.contributor.author | McFadzean, S. | |
dc.contributor.author | Docherty, F.T. | |
dc.contributor.author | Craven, A.J. | |
dc.contributor.author | McComb, D.W. | |
dc.contributor.author | De Gendt, Stefan | |
dc.date.accessioned | 2021-10-16T17:54:40Z | |
dc.date.available | 2021-10-16T17:54:40Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12568 | |
dc.source | IIOimport | |
dc.title | Nucleation, crystallization and phase segregation in HfO2 and HfSiO | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | De Gendt, Stefan | |
dc.contributor.orcidimec | De Gendt, Stefan::0000-0003-3775-3578 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 325 | |
dc.source.endpage | 328 | |
dc.source.conference | Microscopy of Semiconducting Materials XV | |
dc.source.conferencedate | 2/04/2007 | |
dc.source.conferencelocation | Cambridge UK | |
imec.availability | Published - open access | |
imec.internalnotes | Springer Proceedings in Physics; Vol. 120 | |