dc.contributor.author | Natarajan Iyer, Mahadeva | |
dc.contributor.author | Thijs, Steven | |
dc.contributor.author | Tremouilles, David | |
dc.contributor.author | Linten, Dimitri | |
dc.contributor.author | Collaert, Nadine | |
dc.contributor.author | Jurczak, Gosia | |
dc.contributor.author | Groeseneken, Guido | |
dc.date.accessioned | 2021-10-16T18:07:39Z | |
dc.date.available | 2021-10-16T18:07:39Z | |
dc.date.issued | 2007-07 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12610 | |
dc.source | IIOimport | |
dc.title | ESD protection for sub-45nm MugFET technology | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Thijs, Steven | |
dc.contributor.imecauthor | Linten, Dimitri | |
dc.contributor.imecauthor | Collaert, Nadine | |
dc.contributor.imecauthor | Jurczak, Gosia | |
dc.contributor.imecauthor | Groeseneken, Guido | |
dc.contributor.orcidimec | Thijs, Steven::0000-0003-2889-8345 | |
dc.contributor.orcidimec | Linten, Dimitri::0000-0001-8434-1838 | |
dc.contributor.orcidimec | Collaert, Nadine::0000-0002-8062-3165 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 159 | |
dc.source.endpage | 164 | |
dc.source.conference | 14th IEEE International Symposium on the Physical and Failuire Analysis of Integrated Circuits - IPFA | |
dc.source.conferencedate | 11/07/2007 | |
dc.source.conferencelocation | Bangalore India | |
imec.availability | Published - open access | |