Radiation damage in proton-irradiated stained Si n-MOSFETs

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Authors
Ohtani, T.; Hayama, K.; Takakura, K.; Kudou, T.; Ohyama, H.; Mercha, Abdelkarim; Simoen, Eddy; Claeys, Cor
Conference
26th Electronic Materials Symposium
Title
Radiation damage in proton-irradiated stained Si n-MOSFETs
Publication type
Oral presentation
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