Effect of gate interface on performance degration of irradiated SiC-MESFET

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Authors

Ohyama, H.; Takakura, K.; Yoneoka, M.; Uemura, K.; Motoki, M.; Matsuo, K.; Arai, M.; Kuboyama, S.; Simoen, Eddy; Claeys, Cor

Journal

Physica B

Volume

401-402

Title

Effect of gate interface on performance degration of irradiated SiC-MESFET

Publication type

Journal article

Embargo date

9999-12-31

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