dc.contributor.author | Oprins, Herman | |
dc.contributor.author | Vandevelde, Bart | |
dc.date.accessioned | 2021-10-16T18:20:38Z | |
dc.date.available | 2021-10-16T18:20:38Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/12650 | |
dc.source | IIOimport | |
dc.title | Extracting thermal parameters from electronic pacakges | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Oprins, Herman | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.orcidimec | Oprins, Herman::0000-0003-0680-4969 | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.source.peerreview | no | |
dc.source.conference | Noesis OPTIMUS Worldwide Users Meeting | |
dc.source.conferencedate | 25/06/2007 | |
dc.source.conferencelocation | Leuven Belgium | |
imec.availability | Published - imec | |