Show simple item record

At tape-out: can yield in terms of parametric specifications be predicted?

dc.contributor.authorPapanikolaou, Antonis
dc.contributor.authorMiranda Corbalan, Miguel
dc.contributor.authorMarchal, Pol
dc.contributor.authorDierickx, Bart
dc.contributor.authorCatthoor, Francky
dc.date.accessioned2021-10-16T18:27:41Z
dc.date.available2021-10-16T18:27:41Z
dc.date.issued2007-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12672
dc.sourceIIOimport
dc.titleAt tape-out: can yield in terms of parametric specifications be predicted?
dc.typeProceedings paper
dc.contributor.imecauthorCatthoor, Francky
dc.contributor.orcidimecCatthoor, Francky::0000-0002-3599-8515
dc.source.peerreviewyes
dc.source.beginpage773
dc.source.endpage778
dc.source.conferenceIEEE Custom Integrated Circuit Conference - CICC
dc.source.conferencedate16/09/2007
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record