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Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Publication:
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Date
2007-07
Proceedings Paper
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14436.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Papanikolaou, Antonis
;
Wang, Hua
;
Miranda Corbalan, Miguel
;
Catthoor, Francky
Journal
Abstract
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1901
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations
Metrics
Views
1901
since deposited on 2021-10-16
Acq. date: 2025-10-25
Citations