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dc.contributor.authorParvais, Bertrand
dc.contributor.authorHu, Shaojian
dc.contributor.authorDehan, Morin
dc.contributor.authorMercha, Abdelkarim
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2021-10-16T18:28:58Z
dc.date.available2021-10-16T18:28:58Z
dc.date.issued2007-09
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12676
dc.sourceIIOimport
dc.titleAn accurate scalable compact model for the substrate resistance of RF MOSFETs
dc.typeProceedings paper
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorHu, Shaojian
dc.contributor.imecauthorMercha, Abdelkarim
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecMercha, Abdelkarim::0000-0002-2174-6958
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.source.peerreviewyes
dc.source.beginpage503
dc.source.endpage506
dc.source.conferenceIEEE Custom Integrated Circuits Conference - CICC
dc.source.conferencedate16/09/2007
dc.source.conferencelocationSan Jose, CA USA
imec.availabilityPublished - imec


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