Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's

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Authors
Debie, Peter; Martens, Luc; De Zutter, Daniel
Conference
Proceedings IEEE 1994 International Conference on Microelectronic Test Structures
Title
Fast and Accurate On-Wafer Extraction of Parasitic Resistances in GaAs MESFET's
Publication type
Proceedings paper
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