Show simple item record

Study of the junction depth effect on ballistic current using the subband decomposition method

dc.contributor.authorPourghaderi, Mohammad Ali
dc.contributor.authorMagnus, Wim
dc.contributor.authorSoree, Bart
dc.contributor.authorCompernolle, Steven
dc.date.accessioned2021-10-16T18:48:10Z
dc.date.available2021-10-16T18:48:10Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12737
dc.sourceIIOimport
dc.titleStudy of the junction depth effect on ballistic current using the subband decomposition method
dc.typeProceedings paper
dc.contributor.imecauthorMagnus, Wim
dc.contributor.imecauthorSoree, Bart
dc.contributor.orcidimecSoree, Bart::0000-0002-4157-1956
dc.source.peerreviewno
dc.source.conferenceProceedings of the 12th International Conference on Simulation of Semiconductor Devices and Processes - SISPAD
dc.source.conferencedate25/09/2007
dc.source.conferencelocationVienna Austria
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record