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Experimental study of the effective mobility in doped- and undoped-channel triple-gate FinFET structures

dc.contributor.authorRudenko, Tamara
dc.contributor.authorKilchytska, Valeria
dc.contributor.authorCollaert, Nadine
dc.contributor.authorJurczak, Gosia
dc.contributor.authorNazarov, A.
dc.contributor.authorFlandre, Denis
dc.date.accessioned2021-10-16T19:14:53Z
dc.date.available2021-10-16T19:14:53Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12816
dc.sourceIIOimport
dc.titleExperimental study of the effective mobility in doped- and undoped-channel triple-gate FinFET structures
dc.typeOral presentation
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.conferenceEUROSOI Workshop
dc.source.conferencedate24/01/2007
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - imec


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