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Development of Si:As blocked impurity band detector for far IR detection

dc.contributor.authorSabuncuoglu Tezcan, Deniz
dc.contributor.authorPutzeys, Jan
dc.contributor.authorDe Munck, Koen
dc.contributor.authorSouverijns, Tim
dc.contributor.authorMerken, Patrick
dc.contributor.authorFiorini, Paolo
dc.contributor.authorVan Hoof, Chris
dc.contributor.authorDartois, Thierry
dc.contributor.authorIsrabian, Claude
dc.contributor.authorBirkmann, Stephan M.
dc.contributor.authorStegmaier, Jutta
dc.contributor.authorGrözinger, Ulrich
dc.contributor.authorKrause, Oliver
dc.contributor.authorDe Moor, Piet
dc.date.accessioned2021-10-16T19:19:42Z
dc.date.available2021-10-16T19:19:42Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12830
dc.sourceIIOimport
dc.titleDevelopment of Si:As blocked impurity band detector for far IR detection
dc.typeProceedings paper
dc.contributor.imecauthorSabuncuoglu Tezcan, Deniz
dc.contributor.imecauthorPutzeys, Jan
dc.contributor.imecauthorDe Munck, Koen
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.imecauthorDe Moor, Piet
dc.contributor.orcidimecSabuncuoglu Tezcan, Deniz::0000-0002-9237-7862
dc.contributor.orcidimecPutzeys, Jan::0000-0001-8834-5852
dc.source.peerreviewno
dc.source.beginpage66600R
dc.source.conferenceInfrared Systems and Photoelectronic Technology II
dc.source.conferencedate26/08/2007
dc.source.conferencelocationSan Diego, CA USA
imec.availabilityPublished - imec
imec.internalnotesProceedings of SPIE; vol. 6660


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