Authors

Sahhaf, Sahar; Degraeve, Robin; Roussel, Philippe; Kaczer, Ben; Kauerauf, Thomas; Groeseneken, Guido

Conference

38th IEEE Semiconductor Interfaces Specialists Conference

Title

Impact of the hard breakdown detection method on the extraction of the Wearout distribution parameters

Publication type

Oral presentation

Embargo date

9999-12-31