Show simple item record

Defect control for Ge/Si and Ge1-xSnx/Ge/Si heterostructures

dc.contributor.authorSakai, Akira
dc.contributor.authorTakeuchi, Shotaro
dc.contributor.authorNakatsuka, Osamu
dc.contributor.authorOgawa, Masaki
dc.contributor.authorZaima, Shigeaki
dc.date.accessioned2021-10-16T19:21:06Z
dc.date.available2021-10-16T19:21:06Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12834
dc.sourceIIOimport
dc.titleDefect control for Ge/Si and Ge1-xSnx/Ge/Si heterostructures
dc.typeMeeting abstract
dc.source.peerreviewno
dc.source.beginpage31
dc.source.endpage32
dc.source.conference5th International Symposium on Control of Semiconductor Interfaces - ISCSI-V
dc.source.conferencedate12/11/2007
dc.source.conferencelocationTokyo Japan
dc.identifier.urlhttp://www.comp.metro-u.ac.jp/iscsi-5/
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record