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A reliable metric for mobility extraction of short channel MOSFETs

dc.contributor.authorSeveri, Simone
dc.contributor.authorPantisano, Luigi
dc.contributor.authorAugendre, Emmanuel
dc.contributor.authorSan Andres Serrano, Enrique
dc.contributor.authorEyben, Pierre
dc.contributor.authorDe Meyer, Kristin
dc.date.accessioned2021-10-16T19:36:29Z
dc.date.available2021-10-16T19:36:29Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12879
dc.sourceIIOimport
dc.titleA reliable metric for mobility extraction of short channel MOSFETs
dc.typeJournal article
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorEyben, Pierre
dc.contributor.imecauthorDe Meyer, Kristin
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage2690
dc.source.endpage2698
dc.source.journalIEEE Transaction Electron Devices
dc.source.issue10
dc.source.volume54
imec.availabilityPublished - open access


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