A reliable metric for mobility extraction of short channel MOSFETs

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Authors

Severi, Simone; Pantisano, Luigi; Augendre, Emmanuel; San Andres Serrano, Enrique; Eyben, Pierre; De Meyer, Kristin

Issue

10

Journal

IEEE Transaction Electron Devices

Volume

54

Title

A reliable metric for mobility extraction of short channel MOSFETs

Publication type

Journal article

Embargo date

9999-12-31

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