A reliable metric for mobility extraction of short channel MOSFETs

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Author(s)

;

Pantisano, Luigi

;

Augendre, Emmanuel

;

San Andres Serrano, Enrique

;

;

De Meyer, Kristin

Journal

IEEE Transaction Electron Devices

Metrics

1916 since deposited on 2021-10-16

Acq. date: 2025-10-23