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Negligible effect of process-induced strain on intrinsic NBTI behavior

dc.contributor.authorShickova, Adelina
dc.contributor.authorKaczer, Ben
dc.contributor.authorVerheyen, Peter
dc.contributor.authorEneman, Geert
dc.contributor.authorSan Andres Serrano, Enrique
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAbsil, Philippe
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T19:41:15Z
dc.date.available2021-10-16T19:41:15Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12892
dc.sourceIIOimport
dc.titleNegligible effect of process-induced strain on intrinsic NBTI behavior
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.source.peerreviewno
dc.source.beginpage242
dc.source.endpage244
dc.source.journalIEEE Electron Device Letters
dc.source.issue3
dc.source.volume28
imec.availabilityPublished - imec


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