Publication:

Negligible effect of process-induced strain on intrinsic NBTI behavior

Date

2007

Journal article

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Author(s)

Shickova, Adelina

;

;

Verheyen, Peter

;

;

San Andres Serrano, Enrique

;

;

Absil, Philippe

;

;

Groeseneken, Guido

Journal

IEEE Electron Device Letters

Statistics

1928 since deposited on 2021-10-16

Acq. date: 2026-02-25