Publication:

Negligible effect of process-induced strain on intrinsic NBTI behavior

Date

2007

Journal article

Simple item page Full metadata Statistics

Author(s)

Shickova, Adelina

;

;

Verheyen, Peter

;

;

San Andres Serrano, Enrique

;

;

Absil, Philippe

;

;

Groeseneken, Guido

Journal

IEEE Electron Device Letters

Statistics

1931 since deposited on 2021-10-16

1last month

Acq. date: 2026-05-18