Publication:

Negligible effect of process-induced strain on intrinsic NBTI behavior

Date

2007
Journal article
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dc.contributor.authorShickova, Adelina
dc.contributor.authorKaczer, Ben
dc.contributor.authorVerheyen, Peter
dc.contributor.authorEneman, Geert
dc.contributor.authorSan Andres Serrano, Enrique
dc.contributor.authorJurczak, Gosia
dc.contributor.authorAbsil, Philippe
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorJurczak, Gosia
dc.contributor.imecauthorAbsil, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.date.accessioned2021-10-16T19:41:15Z
dc.date.available2021-10-16T19:41:15Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12892
dc.source.beginpage242
dc.source.endpage244
dc.source.issue3
dc.source.journalIEEE Electron Device Letters
dc.source.volume28
dc.title

Negligible effect of process-induced strain on intrinsic NBTI behavior

dc.typeJournal article
dspace.entity.typePublication
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