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On the 1/f noise in pMOSFETs with embedded SiGe source/drain

dc.contributor.authorSimoen, Eddy
dc.contributor.authorVerheyen, Peter
dc.contributor.authorShickova, Adelina
dc.contributor.authorHikavyy, Andriy
dc.contributor.authorLoo, Roger
dc.contributor.authorClaeys, Cor
dc.contributor.authorMachkaoutsan, Vladimir
dc.contributor.authorTomasini, P.
dc.contributor.authorThomas, S.G.
dc.date.accessioned2021-10-16T19:47:36Z
dc.date.available2021-10-16T19:47:36Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12910
dc.sourceIIOimport
dc.titleOn the 1/f noise in pMOSFETs with embedded SiGe source/drain
dc.typeMeeting abstract
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorVerheyen, Peter
dc.contributor.imecauthorHikavyy, Andriy
dc.contributor.imecauthorLoo, Roger
dc.contributor.imecauthorMachkaoutsan, Vladimir
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHikavyy, Andriy::0000-0002-8201-075X
dc.contributor.orcidimecLoo, Roger::0000-0003-3513-6058
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage75
dc.source.endpage78
dc.source.conference8th European Workshop on ULtimate Integration of Silicon - ULIS
dc.source.conferencedate15/03/2007
dc.source.conferencelocationLeuven Belgium
imec.availabilityPublished - open access


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