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Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
Publication:
Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
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Date
2007
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Takakura, K.
;
Aoki, Y.
;
Hayama, K.
;
Oyana, H.
;
Simoen, Eddy
;
Claeys, Cor
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1885
since deposited on 2021-10-16
Acq. date: 2026-01-08
Citations
Metrics
Views
1885
since deposited on 2021-10-16
Acq. date: 2026-01-08
Citations