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Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
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Authors
Takakura, K.
;
Aoki, Y.
;
Hayama, K.
;
Oyana, H.
;
Simoen, Eddy
;
Claeys, Cor
Conference
The 12th Int. Conf. on Defect Recognition, Imaging and Physics of Semiconductors - DRIP XII
Title
Electrical properties of strained Si MOSFETs by high-fluence electron-irradiation
Publication type
Oral presentation
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