Show simple item record

Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells

dc.contributor.authorTio Castro, David
dc.contributor.authorGoux, Ludovic
dc.contributor.authorHurkx, G.A.M.
dc.contributor.authorAttenborough, Karen
dc.contributor.authorDelhougne, Romain
dc.contributor.authorLisoni, Judit
dc.contributor.authorJedema, F.J.
dc.contributor.authorin 't Zandt, M.A.A.
dc.contributor.authorWolters, R.A.M.
dc.contributor.authorGravesteijn, Dirk
dc.contributor.authorVerheijen, M.A.
dc.contributor.authorKaiser, M.A.
dc.contributor.authorWeemaes, R.G.R.
dc.contributor.authorWouters, Dirk
dc.date.accessioned2021-10-16T20:09:57Z
dc.date.available2021-10-16T20:09:57Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12974
dc.sourceIIOimport
dc.titleEvidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells
dc.typeProceedings paper
dc.contributor.imecauthorGoux, Ludovic
dc.contributor.imecauthorDelhougne, Romain
dc.contributor.orcidimecGoux, Ludovic::0000-0002-1276-2278
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage315
dc.source.endpage318
dc.source.conferenceTechnical Digest International Electron Devices Meeting - IEDM
dc.source.conferencedate10/12/2007
dc.source.conferencelocationWashington, DC USA
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
14585.pdf
Size:
1.589Mb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record