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Transient voltage overshoot in TLP testing - Real or artifact?

dc.contributor.authorTremouilles, David
dc.contributor.authorThijs, Steven
dc.contributor.authorRoussel, Philippe
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T20:17:01Z
dc.date.available2021-10-16T20:17:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12992
dc.sourceIIOimport
dc.titleTransient voltage overshoot in TLP testing - Real or artifact?
dc.typeJournal article
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewno
dc.source.beginpage1016
dc.source.endpage1024
dc.source.journalMicroelectronics Reliability
dc.source.issue7
dc.source.volume47
imec.availabilityPublished - imec
imec.internalnotesSpecial issue: EOS/ESD Symposium 2005


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