Transient voltage overshoot in TLP testing - Real or artifact?

No Thumbnail [100%x80]
Metadata
Show full item record
Authors
Tremouilles, David; Thijs, Steven; Roussel, Philippe; Mahadeva Iyer, Natarajan; Vassilev, Vesselin; Groeseneken, Guido
Issue
7
Journal
Microelectronics Reliability
Volume
47
Title
Transient voltage overshoot in TLP testing - Real or artifact?
Publication type
Journal article
Collections