Publication:

Transient voltage overshoot in TLP testing - Real or artifact?

Date

2007
Journal article
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dc.contributor.authorTremouilles, David
dc.contributor.authorThijs, Steven
dc.contributor.authorRoussel, Philippe
dc.contributor.authorMahadeva Iyer, Natarajan
dc.contributor.authorVassilev, Vesselin
dc.contributor.authorGroeseneken, Guido
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.date.accessioned2021-10-16T20:17:01Z
dc.date.available2021-10-16T20:17:01Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12992
dc.source.beginpage1016
dc.source.endpage1024
dc.source.issue7
dc.source.journalMicroelectronics Reliability
dc.source.volume47
dc.title

Transient voltage overshoot in TLP testing - Real or artifact?

dc.typeJournal article
dspace.entity.typePublication
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