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dc.contributor.authorTrojman, Lionel
dc.contributor.authorPantisano, Luigi
dc.contributor.authorSeveri, Simone
dc.contributor.authorSan Andres Serrano, Enrique
dc.contributor.authorHoffmann, Thomas Y.
dc.contributor.authorFerain, Isabelle
dc.contributor.authorDe Gendt, Stefan
dc.contributor.authorHeyns, Marc
dc.contributor.authorMaes, Herman
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-16T20:17:52Z
dc.date.available2021-10-16T20:17:52Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/12994
dc.sourceIIOimport
dc.titlePerformance assessment of (110) p-FET high-k/MG: is it mobility or series resistance limited?
dc.typeJournal article
dc.contributor.imecauthorSeveri, Simone
dc.contributor.imecauthorDe Gendt, Stefan
dc.contributor.imecauthorHeyns, Marc
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecDe Gendt, Stefan::0000-0003-3775-3578
dc.source.peerreviewyes
dc.source.beginpage2058
dc.source.endpage2062
dc.source.journalMicroelectronic Engineering
dc.source.issue9_10
dc.source.volume84
imec.availabilityPublished - imec
imec.internalnotesPaper from INFOS 2007


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