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Material and device characterization of thin-film polycrystalline-Si solar cells based on aluminum-induced crystallization and epitaxial growth as a first step towards modeling

dc.contributor.authorVan Gestel, Dries
dc.contributor.authorCarnel, Lodewijk
dc.contributor.authorGordon, Ivan
dc.contributor.authorBeaucarne, Guy
dc.contributor.authorPoortmans, Jef
dc.date.accessioned2021-10-16T20:39:28Z
dc.date.available2021-10-16T20:39:28Z
dc.date.issued2007
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/13054
dc.sourceIIOimport
dc.titleMaterial and device characterization of thin-film polycrystalline-Si solar cells based on aluminum-induced crystallization and epitaxial growth as a first step towards modeling
dc.typeProceedings paper
dc.contributor.imecauthorGordon, Ivan
dc.contributor.imecauthorPoortmans, Jef
dc.contributor.orcidimecGordon, Ivan::0000-0002-0713-8403
dc.contributor.orcidimecPoortmans, Jef::0000-0003-2077-2545
dc.source.peerreviewno
dc.source.beginpage311
dc.source.endpage325
dc.source.conferenceProceedings of the International Workshop on Numerical Modeling of Thin Film Solar Cells
dc.source.conferencedate28/03/2007
dc.source.conferencelocationGent Belgium
imec.availabilityPublished - imec


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