dc.contributor.author | Van Steenberge, Nele | |
dc.contributor.author | Limaye, Paresh | |
dc.contributor.author | Willems, Geert | |
dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Schildermans, Inge | |
dc.date.accessioned | 2021-10-16T20:55:55Z | |
dc.date.available | 2021-10-16T20:55:55Z | |
dc.date.issued | 2007 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13100 | |
dc.source | IIOimport | |
dc.title | Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly | |
dc.type | Journal article | |
dc.contributor.imecauthor | Willems, Geert | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.orcidimec | Willems, Geert::0000-0002-9137-618X | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.source.peerreview | no | |
dc.source.beginpage | 215 | |
dc.source.endpage | 222 | |
dc.source.journal | Microelectronics Reliability | |
dc.source.issue | 2_3 | |
dc.source.volume | 47 | |
imec.availability | Published - imec | |